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2. | | LEITE, F. L.; HERRMANN, P. S. P. Caracterization of adhesion force, of two soil minerals particles (mica and siicon), in the nanoscale, using atomic force microscopy (AFM). Acta Microscopica, Maracaibo, v.12, Apr. 2003. Supplement A. CD de trabalhos e resumos apresentados no Second Latin American Symposium on Scanning Microscopy, Búzios, Apr. 2003. 2 f. 1 CD-ROM. Biblioteca(s): Embrapa Instrumentação. |
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7. | | BORATO, C. E.; LEITE, F. L.; OLIVEIRA JR, O. N.; MATTOSO, L. H. C. Efficient taste sensors made of bare metal electrodes. Sensor Letters, University Park, Pennsylvania, v. 4, n. 2, p. 1-5, 2006. Biblioteca(s): Embrapa Instrumentação. |
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11. | | HERRMANN, P.; LEITE, F. L.; MATTOSO, L. C.; OLIVEIRA JUNIOR, O. Atomic force spectroscopy as a tool to study the electrical conductivity of polyaniline and derivatives. In: INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY - NANO, 9., 2006, Basel. Final Program... Basel, 2006. Entrada padronizada: HERRMANN, P. S. P.
Entrada padronizada: MATTOSO, L. H. C. Biblioteca(s): Embrapa Instrumentação. |
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15. | | STEFFENS, C.; SANDOVAL, R. D.; MANZOLI, A.; LEITE, F. L.; FATIBELLO, O.; HERRMANN, P. S. P. Investigation of a sensitive layer of polyaniline as coating for microcantilever as a nanosensor. In: NANOMECHANICAL SENSING WORKSHOP-NMC, 9., Bombay Mumbai, India. Proceedings... Bombay: National Program on Micro and Smart Systems - NPMASS, Indian Nanoelectronics Users Program - INUP, 2012. p. 78-79. Biblioteca(s): Embrapa Instrumentação. |
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17. | | STEFFENS, C.; SANDOVAL, R. D.; MANZOLI, A.; LEITE, F. L.; HERRMANN, P. S. P. Sensores de microcantilever revestidos com polímeros condutores, utilizado na detecção de umidade relativa. In: WORKSHOP DA REDE DE NANOTECNOLOGIA APLICADA AO AGRONEGÓCIO, 6., 2012, Fortaleza. Anais... São Carlos: Embrapa Instrumentação; Fortaleza: Embrapa Agroindústria Tropical, 2012. p. 79-81. Editores: Maria Alice Martins, MOrsyleide de Freitas Rosa, Men de Sá Moreira de Souza Filho, Nicodemos Moreira dos Santos Junior, Odílio Benedito Garrido de Assis, Caue Ribeiro, Luiz Henrique Capparelli Mattoso. Biblioteca(s): Embrapa Instrumentação. |
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19. | | LEITE, F. L.; MANZOLI, A.; ALVES, W. F.; HERRMANN P. S. P.; MATTOSO, L. H. C.; OLIVEIRA JUNIOR, O. N. Estimation of molecular weight and polydispersity in conducting polymers using single-molecule force spectroscopy. In: ENCONTRO DA SOCIEDADE BRASILEIRA DE PESQUISA EM MATERIAIS - SBPMat, 7., 2008, Guarujá; BRAZILIAN MRS MEETING, 7., 2008, Guarujá. Abstracts... Rio de Janeiro: SBPMat, 2008. não paginado. 1CD-ROM. Entrada padronizada: HERRMANN JUNIOR, P. S. de P. Biblioteca(s): Embrapa Instrumentação. |
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20. | | LEITE, F. L.; SIMÕES, M. L.; HERRMANN, P. S. P.; MARTIN NETO, L.; MATTOSO, L. H. C.; OLIVEIRA, O. N. Evidence of conducting islands on polyaniline films: charge nanocarriers. In: ENCONTRO DA SOCIEDADE BRASILEIRA DE PESQUISA EM MATERIAIS - SbpMat, 6., 2007, Natal; BRAZILIAN MRS MEETING, 6., 2007, Natal. Abstracts... Natal: SBMat, 2007. 1 CD-ROM. Não paginado. Biblioteca(s): Embrapa Instrumentação. |
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Registros recuperados : 66 | |
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| Acesso ao texto completo restrito à biblioteca da Embrapa Instrumentação. Para informações adicionais entre em contato com cnpdia.biblioteca@embrapa.br. |
Registro Completo
Biblioteca(s): |
Embrapa Instrumentação. |
Data corrente: |
23/03/2005 |
Data da última atualização: |
23/03/2005 |
Autoria: |
LEITE, F. L.; RIUL JÚNIOR, A.; HERRMANN, P. S. P. |
Título: |
Mapping of adhesion forces on soil minerals in air and water by atomic force spectroscopy (AFS). |
Ano de publicação: |
2003 |
Fonte/Imprenta: |
Journal of adhesion Science and Technology, v. 17, n. 16, p. 2141-2156, 2003. |
Idioma: |
Inglês |
Conteúdo: |
The adhesion force between an atomic force microscope (AFM) tip and sample surfaces, mica and quartz substrates, was measured in air and water. The force curves show that the adhesion has a strong dependence on both the surface roughness and the environmental conditions surrounding the sample. The variability of the adhesion force was examined in a series of measurements taken at the same point, as well as at different places on the sample surface. The adhesion maps obtained from the distribution of the measured forces indicated regions contaminated by either organic compounds or adsorbed water. Using simple mathematical expressions we could quantitatively predict the adhesion force behavior in both air and water. The experimental results are in good agreement with theoretical calculations, where the adhesion forces in air and water were mostly associated with capillary and van der Waals forces, respectively. A smalllong-range repulsive force is also observed in water due to the overlapping electrical double-layers formed on both the tip and sample surfaces. |
Palavras-Chave: |
Forças de Adesão; Microscopia de Força Atômica; Minerais do Solo; Spectroscopia de Força Atômica. |
Categoria do assunto: |
-- |
Marc: |
LEADER 01702naa a2200193 a 4500 001 1028873 005 2005-03-23 008 2003 bl --- 0-- u #d 100 1 $aLEITE, F. L. 245 $aMapping of adhesion forces on soil minerals in air and water by atomic force spectroscopy (AFS). 260 $c2003 520 $aThe adhesion force between an atomic force microscope (AFM) tip and sample surfaces, mica and quartz substrates, was measured in air and water. The force curves show that the adhesion has a strong dependence on both the surface roughness and the environmental conditions surrounding the sample. The variability of the adhesion force was examined in a series of measurements taken at the same point, as well as at different places on the sample surface. The adhesion maps obtained from the distribution of the measured forces indicated regions contaminated by either organic compounds or adsorbed water. Using simple mathematical expressions we could quantitatively predict the adhesion force behavior in both air and water. The experimental results are in good agreement with theoretical calculations, where the adhesion forces in air and water were mostly associated with capillary and van der Waals forces, respectively. A smalllong-range repulsive force is also observed in water due to the overlapping electrical double-layers formed on both the tip and sample surfaces. 653 $aForças de Adesão 653 $aMicroscopia de Força Atômica 653 $aMinerais do Solo 653 $aSpectroscopia de Força Atômica 700 1 $aRIUL JÚNIOR, A. 700 1 $aHERRMANN, P. S. P. 773 $tJournal of adhesion Science and Technology$gv. 17, n. 16, p. 2141-2156, 2003.
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